Integrated circuit metrology II: May 3-4, 1984, Arlington,

Format: Paperback

Language: English

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Consider each fault independently (i.e. one at a time, no multiple faults): Resistor R1 fails open: Vout becomes equal to 0 volts all the time. This effect increases as the output transistor current increases so keeping the value of RL high will help reduce the problem. This field is optional, but recommended for clarity. Thus, it is not possible for the activation code stored in the non-programmable non-volatile memory to be re-written into the erasable non-volatile memory.

Pages: 172

Publisher: SPIE--the International Society for Optical Engineering (1984)

ISBN: 0892525150

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